基于藍寶石襯底的全區(qū)域覆蓋的單層二硒化鎢

簡要描述：This product contains full area coverage WSe2 monolayers on c-cut sapphire substrates. Sample size measures 1cm in size and the entire sample surface contains monolayer thick WSe2 sheet.

更新時間：2024-06-03
產品型號：
廠商性質：生產廠家
訪問量：638

產品咨詢聯(lián)系我們

產品分類

二維材料

鈣鈦礦/OLED 異質結 MOFS材料其他二維材料二維材料溶液二維材料薄膜二維材料粉末絕緣體黑磷六方氮化硼晶體碲化物晶體硒化物晶體硫化物晶體查看全部產品

詳細介紹

This product contains full area coverage WSe2 monolayers on c-cut sapphire substrates. Sample size measures 1cm in size and the entire sample surface contains monolayer thick WSe2 sheet. Synthesized full area coverage monolayer WSe2 is highly luminescent and Raman spectroscopy studies also confirm the monolayer thickness (please see the technical specifications)

Sample Properties.

Sample size	1cm x 1cm square shaped
Substrate type	Sapphire c-cut (0001)
Coverage	Full monolayer coverage
Electrical properties	1.62 eV Direct Bandgap Semiconductor
Crystal structure	Hexagonal Phase
Unit cell parameters	a = b = 0.327 nm, c = 1.295 nm, α = β = 90°, γ = 120°
Production method	Low pressure Chemical Vapor Deposition (LPCVD)
Characterization methods	Raman, photoluminescence, TEM, EDS

Specifications

1) Identification. Full coverage 100% monolayer WSe2 uniformly covered across c-cut sapphire

2) Physical dimensions. One centimeter in size. Larger sizes up to 2-inch wafer-scale available upon requests.

3) Smoothness. Atomically smooth surface with roughness < 0.15 nm.

4) Uniformity. Highly uniform surface morphology. WSe2 monolayers uniformly cover across the sample.

5) Purity. 99.9995% purity as determined by nano-SIMS measurements

6) Reliability. Repeatable Raman and photoluminescence response

7) Crystallinity. High crystalline quality, Raman response, and photoluminescence emission comparable to single crystalline monolayer flakes.

8) Substrate. c-cut Sapphire but our research and development team can transfer WSe2 monolayers onto variety of substrates including PET, quartz, and SiO2/Si without significant compromisation of material quality.

9) Defect profile. WSe2 monolayers do not contain intentional dopants or defects. However, our technical staff can produce defected WSe2 using α-bombardment technique.

Supporting datasets [Full area coverage monolayer WSe2 on c-cut Sapphire]

Transmission electron images (TEM) acquired from CVD grown full area coverage WSe2 monolayers on c-cut sapphire confirming highly crystalline nature of monolayers

Room temperature photoluminescence spectroscopy (PL) and Raman spectroscopy (Raman) measurements performed on CVD grown full area coverage monolayer WSe2 on c-cut sapphire. Raman spectroscopy measurement confirm monolayer nature of the CVD grown samples and PL spectrum display sharp and bright PL peak located at 1.67 eV in agreement with the literature.

產品咨詢

留言框

產品：
您的單位：
您的姓名：
聯(lián)系電話：
常用郵箱：
省份：
詳細地址：
補充說明：
驗證碼：

請輸入計算結果（填寫阿拉伯數(shù)字），如：三加四=7

上一篇：基于藍寶石襯底的全區(qū)域覆蓋的少層二硒化鉑
下一篇：基于藍寶石襯底的全區(qū)域覆蓋的單層二硫化鎢

基于藍寶石襯底的全區(qū)域覆蓋的單層二硒化鎢

留言框

產品：

您的單位：

您的姓名：

聯(lián)系電話：

常用郵箱：

省份：

詳細地址：

補充說明：

驗證碼：