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簡要描述:晶體尺寸:10毫米電學性能:半導體,拓撲絕緣體,熱電材料晶體結(jié)構(gòu):單斜晶結(jié)構(gòu)晶胞參數(shù):a = 1.430nm,B = 0.403nm,C = 0.986nm,α=γ= 90°,β= 95.40晶體類型:合成晶體純度:>99.995%表征方法:XRD、拉曼、EDX
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晶體尺寸:10毫米
電學性能:半導體,拓撲絕緣體,熱電材料
晶體結(jié)構(gòu):單斜晶結(jié)構(gòu)
晶胞參數(shù):a = 1.430nm,B = 0.403nm,C = 0.986nm,α=γ= 90°,β= 95.40
晶體類型:合成
晶體純度:>99.995%
表征方法:XRD、拉曼、EDX
Powder X-ray diffraction (XRD) of a single crystal As2Te3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal As2Te3 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal As2Te3. Measurement was performed with a 785 nm Raman system at room temperature.
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